EDAA Lifetime Achievement Award 2007 Goes to T.W. WILLIAMS at DATE 2007

Sandip Kundu and Abhijit Chatterjee
IEEE Fellows
To Receive Awards at DATE 2007

Lifetime Achievement Award -- Additional Award Recipients

Lifetime Achievement Award

The EDAA Lifetime Achievement Award 2007 goes to T.W. WILLIAMS.

The Lifetime Achievement Award is given to individuals who made outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems in their life. In order to be eligible, candidates must have made innovative contributions which had an impact on the way electronic systems are being designed.

Past recipients have been Kurt ANTREICH (2003), Hugo DE MAN (2004), Jochen JESS (2005), and Robert BRAYTON (2006).

The Award will be presented at the plenary session of the 2007 DATE Conference, to be held 16-20 April in Nice, France.

About Dr. Williams
Thomas W. Williams is a Synopsys Fellow at Synopsys, Inc. He is an Adjunct Professor at the University of Calgary, Alberta, Canada. Prior to Synopsys, Inc., Dr. Williams was with IBM Microelectronics Division in Boulder, Colorado, as manager of the VLSI Design For Testability group, which dealt with design for testability of IBM products. He received a BSEE from Clarkson University, an MA in pure mathematics from the State University of New York at Binghamton, and a Ph.D. in electrical engineering from Colorado State University. Thomas W. WILLIAMS with Edward B. EICHELBERGER published the first paper on the Level-Sensitive Scan Design technique (LSSD) for testing logic circuits. Since then Thomas W. Williams has been leading, defining, and promoting design for testability concepts, and has had a significant influence on the IC design community to adopt full scan as a de facto standard. As a result of his effort, the EDA industry has been able to base many of its leading tools upon the foundation of the full scan design structure. Prior to the adoption of full scan the industry had to deal with sequential complexity of a non-scan design. Now with the knowledge that designs are full scan, it has become a pragmatic basis for a full range of today’s design tools, including mainstream Logic Synthesis, Static Timing Analysis and Formal Verification solutions.

Thomas W. Williams was a founding member of the IEEE Test Technology Committee. He started the first workshop of the IEEE Test Technology Technical Committee - the DFT Workshop also known as the “Vail Workshop” - the first Test Workshop of any kind in 1978. He also co-founded the first Test Workshop in Europe – the European DFT Workshop. This later grew into the European Test Conference and then into a significant portion of DATE.

He has authored a number of seminal papers in support of the adoption and enhancing of the scan technique, including the first LSSD paper. In addition to being an IEEE Fellow, Thomas W. Williams has received a number of Awards, including the W. Wallace Mc Dowell Award from the IEEE Computer Society that he shared with Ed EICHELBERGER in 1989. Previous recipients were John W. BACKUS, Seymour CRAY, Gene AMDHAL, Grace Murray HOPPER, Gordon E. MOORE, C. Gordon BELL. In 1997, he was presented an IBM Corporation Award for Test by President and CEO of IBM, Louis V. GERSTNER.

About EDAA
EDAA is a non-profit association. Its purpose is to operate for educational, scientific and technical purposes for the benefit of the international electronics design and design automation community. The Association, in the field of design and design automation of electronic circuits and systems, promotes a series of high quality technical international conferences and workshops across Europe and cooperates actively to maintain harmonious relationships with other national and international technical societies and groups promoting the purpose of the Association. For additional information contact: B. COURTOIS, EDAA Chair, tel : +33 476 57 46 15, Bernard.Courtois@imag.fr

Additional Award Recipients

Awards to be presented at DATE 2007 Sandip KUNDU and Abhijit CHATTERJEE, recently promoted IEEE Fellows, have decided to receive their Awards at DATE 2007
	Sandip Kundu: for contributions to design of test methods for integrated circuits.
	Abhijit Chatterjee: for contributions to testing analog and mixed signal circuits.

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